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SEMI MF1188 — Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption with Short Baseline
This Standard defines three methods for testing chemical durability of various flat panel display substrates: (Method A) Weight Loss
the testing position
SEMI D74-0116 (first published)
E This standard was editorially modified in February 2007 to correct an error
G06400 - SEMI G64 - 全面めっきIC用リードフレーム（金，銀，銅，ニッケル，パラジウム/ニッケル，およびパラジウム）の仕様 Revision:SEMI G64-96 (Reapproved 0811) - Superseded SEMI MF1188 — Test MethodNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI Assembly & Packaging Global Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1996200411 : P. P. F. SI Referenced SEMI Standards SEMI G4 Specification for Integrated Circuit